Sub-Angstrom high-resolution transmission electron microscopy at 300 keV.

  title={Sub-Angstrom high-resolution transmission electron microscopy at 300 keV.},
  author={M. A. O'Keefe and Crispin J. D. Hetherington and Yearnchee Curtis Wang and E. Chris Nelson and J Harvey Turner and C Kisielowski and Johan Malm and Roger Mueller and Jan Ringnalda and Ming Xiang Pan and Andreas Thust},
  volume={89 4},
Sub-Angstrom transmission electron microscopy has been achieved at the National Center for Electron Microscopy (NCEM) by a one-Angstrom microscope (OAM) project using software and enhanced hardware developed within a Brite-Euram project (Ultramicroscopy 64 (1996) 1). The NCEM OAM provides materials scientists with transmission electron microscopy at a resolution better than 1 A by using extensive image reconstruction to exploit the significantly higher information limit of an FEG-TEM over its… CONTINUE READING