Study on Magnetic Probe Calibration in Near-field Measurement System for EMI Application

@article{Tian2017StudyOM,
  title={Study on Magnetic Probe Calibration in Near-field Measurement System for EMI Application},
  author={Gengxin Tian and Jun Li and Xiaofang Liu and Lixi Wan and Liqiang Cao},
  journal={J. Electronic Testing},
  year={2017},
  volume={33},
  pages={741-750}
}
Near-field measurement, as an efficient method for studying the electromagnetic interference (EMI) problem, is becoming increasingly important. The calibration of the nearfield probe is a critical part in the measurement procedure. This paper presents a fast and effective calibration method of magnetic probe. The factors that influence the calibration… CONTINUE READING