Study of the desorption/ionization mechanism in electrospray droplet impact secondary ion mass spectrometry.

Abstract

Electrospray droplet impact (EDI) secondary ion mass spectrometry (SIMS) is a desorption/ionization technique for mass spectrometry in which highly charged water clusters produced from an atmospheric-pressure electrospray are accelerated in vacuum by several kV and impact on the sample deposited on the metal substrate. The abundances of the secondary ions… (More)
DOI: 10.1002/rcm.4909

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