Study of point spread in the aberration-corrected transmission electron microscopy.

@article{Ge2014StudyOP,
  title={Study of point spread in the aberration-corrected transmission electron microscopy.},
  author={Binghui Ge and Yumei Wang and Yunjie Chang and Yuan Yao},
  journal={Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada},
  year={2014},
  volume={20 5},
  pages={1447-52}
}
High precision determination of atomic position is necessary for quantitative electron microscopy so that small width of peaks, which represent atoms in structural images, adequate resolution, and sufficiently strong image contrast are needed. The width of peak is usually determined by the point spread (PS) of instruments, but the PS of objects should also be taken into consideration in aberration-corrected transmission electron microscopy when point resolution of a microscope reaches the sub… CONTINUE READING

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