Study of Basic Effects of HPM Pulses in Digital CMOS Integrated Circuit Inputs

@article{Holloway2012StudyOB,
  title={Study of Basic Effects of HPM Pulses in Digital CMOS Integrated Circuit Inputs},
  author={Michael A. Holloway and Zeynep Dilli and Nuttiiya Seekhao and J. C. Rodgers},
  journal={IEEE Transactions on Electromagnetic Compatibility},
  year={2012},
  volume={54},
  pages={1017-1027}
}
The potential of high-power microwave radiation to couple into and generate malfunction in microelectronic systems has become a serious concern; however, the underlying electronic mechanisms are not well understood. We present results of experiments on the response of a typical CMOS integrated circuit to pulsed microwave excitation. Our results show that… CONTINUE READING