Structure and Metrology for a Single-wire Analog

@inproceedings{Lu1994StructureAM,
  title={Structure and Metrology for a Single-wire Analog},
  author={Yunsheng Lu and Weiwei Mao and Ramaswami Dandapani and Ravi K. Gulati},
  booktitle={ITC},
  year={1994}
}
A structure for testing the interconnect faults and measurement of discrete components on mixed-signal boards is proposed. The structure requires one analog pin in addition to the IEEE 1149.1 pins on each mixed-signal IC. Simulation results are provided to show the accuracy of the metrology.