Structural transitions of epitaxial ceria films on Si(111).

@article{Wilkens2013StructuralTO,
  title={Structural transitions of epitaxial ceria films on Si(111).},
  author={Henrik Wilkens and O Schuckmann and R Oelke and Sebastian Gevers and Michael Reichling and Andreas Sch{\"a}fer and Marcus Baeumer and Marvin Hartwig Zoellner and Guangda Niu and Thomas Schr{\"o}der and Joachim Wollschl{\"a}ger},
  journal={Physical chemistry chemical physics : PCCP},
  year={2013},
  volume={15 42},
  pages={18589-99}
}
The structural changes of a (111) oriented CeO2 film grown on a Si(111) substrate covered with a hex-Pr2O3(0001) interface layer due to post deposition annealing are investigated. X-ray photoelectron spectroscopy measurements revealing the near surface stoichiometry show that the film reduces continuously upon extended heat treatment. The film is not… CONTINUE READING