Structural Fault Modelling in Nano Devices

@inproceedings{Gaur2008StructuralFM,
  title={Structural Fault Modelling in Nano Devices},
  author={Manoj Singh Gaur and Raghavendra Narasimhan and Vijay Laxmi and Ujjwal Kumar},
  booktitle={NanoNet},
  year={2008}
}
In this paper we present a model for structural failures in nano-devices. Fault being considered include stuck-at and bridge faults only. This model is an extension of probabilistic model based on Gibbs energy distribution and belief propagation as presented in NANOLAB [1]. Results have been carried out on a 8-bit full adder circuit. Simulation results indicate that probabilistic TMR model represents bridge and stuck-at-1 faults better while deterministic model is more suited for stuck-at-0… 
2 Citations
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