Strip line detection and thinning by RPCL-based local PCA

Abstract

We solve the tasks of strip line detection and thinning in image processing and pattern recognition with the help of a statistical learning technique called rival penalized competitive learning based local principal component analysis. Due to its model selection and noise resistance ability, the technique is experimentally shown to outperform conventional Hough transform and thinning algorithms. 2003 Elsevier B.V. All rights reserved.

DOI: 10.1016/S0167-8655(03)00059-X

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@article{Liu2003StripLD, title={Strip line detection and thinning by RPCL-based local PCA}, author={Zhiyong Liu and Kai Chun Chiu and Lei Xu}, journal={Pattern Recognition Letters}, year={2003}, volume={24}, pages={2335-2344} }