StressTest: an automatic approach to test generation via activity monitors

  title={StressTest: an automatic approach to test generation via activity monitors},
  author={Ilya Wagner and Valeria Bertacco and Todd M. Austin},
  journal={Proceedings. 42nd Design Automation Conference, 2005.},
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced microprocessor vendors to employ immense verification teams in the hope of finding the most critical bugs in a timely manner. Unfortunately, too often size doesn't seem to matter for verification teams, as design schedules continue to slip and microprocessors find their way to the marketplace with design errors. In… CONTINUE READING
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