Stress-induced frequency shifts in langasite thickness-mode resonators

  title={Stress-induced frequency shifts in langasite thickness-mode resonators},
  author={John A. Kosinski and Robert A. Pastore and Xiaomeng Yang and Jiashi Yang and Joseph A. Turner},
  journal={IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control},
In this paper, we report on our study of stress induced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly rotated, specified by angles phi and thetas. The stresses are assumed to be uniform and planar. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. The dependence of frequency shifts on phi and thetas is calculated and examined, and loci of stress-compensation are determined. 

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Influence of static electric field, mechanical pressure and temperature on the propagation of acoustic waves in la3Ga5sio14 piezoelectric single crystals

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