Strain evolution during spinodal decomposition of TiAlN thin films

@inproceedings{Rogstrm2012StrainED,
  title={Strain evolution during spinodal decomposition of TiAlN thin films},
  author={Lina Rogstr{\"o}m and Jennifer Ullbrand and Jonathan Almer and Lars Hultman and Bo G Jansson and Magnus Od{\'e}n},
  year={2012}
}
We use a combination of in-situ x-ray scattering experiments during annealing and phasefield simulations to study the strain and microstructure evolution during decomposition of TiAlN thin films. The evolved microstructure is observed to depend on the initial alloy composition, where the larger elastic anisotropy of higher Al content films causes formation of elongated AlN and TiN domains. The simulations show strain formation in the evolving cubic AlN and TiN domains, which is a combined… CONTINUE READING
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