Strain distribution and defect analysis in III-nitrides by dynamical AFM analysis.


Here, we report on significant material information provided by semi-contact phase-images in a wide range of hard III-nitride surfaces. We show that the phase contrast, which is fundamentally related to the energy dissipation during tip-surface interaction, is sensitive to the crystalline nature of the material and thus could potentially be used to… (More)
DOI: 10.1088/0957-4484/24/14/145701


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