Step-edge calibration of torsional sensitivity for lateral force microscopy

@inproceedings{Sul2009StepedgeCO,
  title={Step-edge calibration of torsional sensitivity for lateral force microscopy},
  author={Onejae Sul and Eui-Hyeok Yang},
  year={2009}
}
A novel calibration technique has been developed for lateral force microscopy (LFM). Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate is required for LFM calibration. The new calibration technique reported in this paper greatly reduces the required preparation processes by simply scanning over a rigid step and measuring the response of the AFM photodiode in the normal and lateral directions. When an AFM tip touches a step while scanning, the tip… CONTINUE READING