Statistical prediction of circuit aging under process variations

  title={Statistical prediction of circuit aging under process variations},
  author={Wenping Wang and Vijay Reddy and Bo Yang and Varsha Balakrishnan and Srikanth Krishnan and Yu Cao},
  journal={2008 IEEE Custom Integrated Circuits Conference},
Accurate prediction of circuit aging and its variability is essential to reliable design and analysis. Such a capability further helps reduce the load in statistical reliability test. Based on compact models of transistor degradation and circuit performance, we develop analytical solutions that efficiently predict the statistics of both circuit timing and the leakage under temporal stress and process variations. These solutions prove that circuit aging and its variance can be fully predicted… CONTINUE READING

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