Statistical multilayer process space coverage for at-speed test


Increasingly large process variations make selection of a set of critical paths for at-speed testing essential yet challenging. This paper proposes a novel <i>multilayer process space coverage metric</i> to quantitatively gauge the quality of path selection. To overcome the exponential complexity in computing such a metric, this paper reveals its… (More)
DOI: 10.1145/1629911.1630004


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