Statistical modeling of gate-delay variation with consideration of intra-gate variability

  title={Statistical modeling of gate-delay variation with consideration of intra-gate variability},
  author={Ken-ichi Okada and Kento Yamaoka and Hidetoshi Onodera},
This paper proposes a model to calculate slatistical gate-delay variation caused by intra-chip and inter-chip variabilities. The variation of each gate delay directly influences the variation of circuit delay, so it is important to characterize each gate-delay variation accurately. Our model characterizes the gate delay by transistor characferistics. Every transistor in a gate affects the transient characteristics of the gate, so it is indispensable to consider the intra-gate variability for… CONTINUE READING


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