Statistical degradation analysis of digital CMOS IC's

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@article{Rangavajjhala1993StatisticalDA, title={Statistical degradation analysis of digital CMOS IC's}, author={Venkata S. Rangavajjhala and Bharat L. Bhuva and Sherra E. Kerns}, journal={IEEE Trans. on CAD of Integrated Circuits and Systems}, year={1993}, volume={12}, pages={837-844} }