Statistical Path Selection for At-Speed Test

  title={Statistical Path Selection for At-Speed Test},
  author={Vladimir Zolotov and Jinjun Xiong and Hanif Fatemi and Chandu Visweswariah},
  journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems},
Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a traditional fault model. Due to parametric variations, different paths can be critical in different parts of the process space, and the union of such paths must be tested to obtain good process space coverage. This paper proposes a novel branch-and-bound algorithm that elegantly and efficiently solves the hitherto open problem of… CONTINUE READING
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