Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs

@article{Fadlallah2002StaticAL,
  title={Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs},
  author={M. Fadlallah and G{\'e}rard Ghibaudo and Jalal Jomaah and M. Zoaeter and G. Gu{\'e}gan},
  journal={Microelectronics Reliability},
  year={2002},
  volume={42},
  pages={41-46}
}
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