Stacking, strain, and twist in 2D materials quantified by 3D electron diffraction

  title={Stacking, strain, and twist in 2D materials quantified by 3D electron diffraction},
  author={Suk Hyun Sung and Noah Schnitzer and Lola Brown and Jiwoong Park and Robert Hovden},
  journal={Physical Review Materials},
The field of two-dimensional (2D) materials has expanded to multilayered systems where electronic, optical, and mechanical properties change-often dramatically-with stacking order, thickness, twist, and interlayer spacing [1-5]. For transition metal dichalcogenides (TMDs), bond coordination within a single van der Waals layer changes the out-of-plane symmetry that can cause metal-insulator transitions [1, 6] or emergent quantum behavior [7]. Discerning these structural order parameters is often… 

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