Speed binning with high-quality structural patterns from functional timing analysis (FTA)


In the nanometer era where the operating speed of a chip decides its price, design companies rely on high-qualty speed binning approaches to maxmizie their profits. The conventional speed binning approach is legacy (i.e. structural) since functional tests are too expensive to derive. Besides legacy and functional tests, recent studies tried to apply the… (More)
DOI: 10.1109/ASPDAC.2016.7428017


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