Spectrum analysis and its application of tunneling current in Scanning tunneling microscopy

@article{Ding2008SpectrumAA,
  title={Spectrum analysis and its application of tunneling current in Scanning tunneling microscopy},
  author={Xin David Ding and Jinghuai Zhang},
  journal={2008 2nd IEEE International Nanoelectronics Conference},
  year={2008},
  pages={1145-1147}
}
By spectra analysis of tunneling current, a novel technique for the simultaneous measurement of tip-sample force interactions in scanning tunneling microscopy (STM) is developed. Frequency spectra of the tunneling current of highly oriented pyrolitic graphite (HOPG) is measured in air with a mechanically cut probe from a wire of Pt-Ir alloy. A frequency peak at about 40 kHz presented to the spectra, which is demonstrated to relavant to the vibration mode perpendicular to the length direction of… CONTINUE READING

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