Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration

  title={Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration},
  author={T. Lohner and E. Ag{\'o}cs and P. Petrik and Z. Zolnai and E. Szil'agyi and I. Kov'acs and Z. SzHokefalvi-Nagy and L. T'oth and A. Toth and L. Ill'es and I. B{\'a}rsony},
  journal={Thin Solid Films},
Abstract In this work recently produced and commercially available glazed ceramic object with metallic lustre decoration was studied by using a spectroscopic ellipsometer with rotating compensator. The thickness and metal content of the surface lustre layers are determined by ion beam analytical techniques, i.e., Rutherford backscattering spectrometry and external beam particle-induced X-ray emission and the results were utilized in the construction of multilayer optical models for the… Expand


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