Special feature: Tutorial. Principles and instrumentation in time‐of‐flight mass spectrometry. Physical and instrumental concepts

@article{Guilhaus1995SpecialFT,
  title={Special feature: Tutorial. Principles and instrumentation in time‐of‐flight mass spectrometry. Physical and instrumental concepts},
  author={Michael Guilhaus},
  journal={Journal of Mass Spectrometry},
  year={1995},
  volume={30},
  pages={1519-1532}
}
  • M. Guilhaus
  • Published 1 November 1995
  • Physics
  • Journal of Mass Spectrometry
The principles of time-of-flight mass spectrometry (TOFMS) are described with a view to understanding the strengths and weaknesses of this method of mass analysis in the context of current applications of mass spectrometry and the more familiar scanning instruments. Fundamental and instrumental factors affecting resolving power, sensitivity and speed are examined. Methods of gating ion populations and the special requirements in the detection and digitisation of the signals in the TOFMS… 

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Time-of-flight mass spectrometry is reviewed from its inception in the 1940s to the present day and of ion sources to the extent that sources influence analyzers.

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  • M. Balcerzak
  • Chemistry
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  • 2003
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Time-of-flight mass spectrometry: Introduction to the basics.

  • U. Boesl
  • Physics
    Mass spectrometry reviews
  • 2017
Basic formulas are presented and discussed with the focus on understanding the physical relations of geometric and electric parameters, initial distribution of ionic parameters, ion flight times, and ion flight time incertitude.
...

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Time-of-flight mass spectrometry (TOF MS) was developed in the late 1940’s, but until the 1990’s its popularity was limited. Recent improvements in TOF technology, including orthogonal acceleration,

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The resolutions of time‐of‐flight (TOF) mass spectrometers using multiple acceleration are compared with respect to their ability to compensate for initial ion velocities while operating in the space

TIME-OF-FLIGHT MASS SPECTROMETER WITH IMPROVED RESOLUTION

A new type of ion gun is described which greatly improves the resolution of a nonmagnetic time‐of‐flight mass spectrometer. The focusing action of this gun is discussed and analyzed mathematically.

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