Special Section on the 2007 IEEE AUTOTESTCON

Abstract

I N 2007, the IEEE AUTOTESTCON came to Baltimore, MD, to provide an open forum in the area of automated and computer-controlled test systems and software for leaders in design, development, procurement, applications, and operations to exchange information relative to their specific needs and disciplines. Our theme for the conference was " Transforming… (More)
DOI: 10.1109/TIM.2008.2005945

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Cite this paper

@article{Sheppard2009SpecialSO, title={Special Section on the 2007 IEEE AUTOTESTCON}, author={John W. Sheppard}, journal={IEEE Trans. Instrumentation and Measurement}, year={2009}, volume={58}, pages={238-239} }