Spatial and temporal phase-measurement techniques: a comparison of major error sources in one dimension

@inproceedings{Schmit1993SpatialAT,
  title={Spatial and temporal phase-measurement techniques: a comparison of major error sources in one dimension},
  author={Joanna Schmit and Katherine Creath and Małgorzata Kujawińska},
  booktitle={Optics \& Photonics},
  year={1993}
}
Spatial and temporal phase-measurement interferometry techniques are affected by a number of sources of error. This paper focuses on the influence of major error sources on the results of phase calculations using the most popular algorithms. These error sources include phase-shifter miscalibration for N-frame temporal methods and its equivalent of the wrong carrier frequency in N-point spatial techniques and detector nonlinearities. Other errors considered are detector nonlinearities and… Expand
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References

SHOWING 1-8 OF 8 REFERENCES
Phase-measurement interferometry: beware these errors
  • K. Creath
  • Physics, Engineering
  • Other Conferences
  • 1992
Phase-measurement interferometry (PMI) techniques enable quantitative measurements to be performed in optical testing, holographic interferometry, and speckle metrology. This paper will presentExpand
Digital wave-front measuring interferometry: some systematic error sources.
TLDR
To study the occurrence of wave-front irregularities caused by dust particles a model has been developed and countermeasures derived which assure sufficient regularity of contour line plots, and the repeatability of the present experimental setup was better than λ/200 within the 3σ limits. Expand
New contra old wavefront measurement concepts for interferometric optical testing
Three new and modified wavefront analysis concepts for interferometric optical testing are presented, specifically a moire fringes version of a temporal phase-shifting method and spatial-carrierExpand
High accuracy Fourier transform fringe pattern analysis
TLDR
The principle of the Fourier transform method of fringe pattern analysis is described with emphasis on the refinements for high accuracy measurements and the possibility of obtaining the overall accuracy of λ/100 is proved. Expand
Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry
A fast-Fourier-transform method of topography and interferometry is proposed. By computer processing of a noncontour type of fringe pattern, automatic discrimination is achieved between elevation andExpand
Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm.
La difference de phase entre les 2 faisceaux interferant varie de maniere connue et on fait des mesures de la distribution d'intensite a travers la pupille correspondant a au moins 3 dephasagesExpand
Installation et utilisation du comparateur photoélectrique et interférentiel du Bureau International des Poids et Mesures
The paper describes the photoelectric and interference comparator of the BIPM, for divided scales and end standards, together with its photoelectric microscopes, its installation (in particular, itsExpand
Schwider , " Advanced evaluation techniques in interferometry
  • Progress in Optics , vol . XXIX edited by
  • 1986