Sparse imaging for fast electron microscopy

@inproceedings{Anderson2013SparseIF,
  title={Sparse imaging for fast electron microscopy},
  author={Hyrum S. Anderson and Jovana Ilic-Helms and Brandon Rohrer and Jason W. Wheeler and Kurt W. Larson},
  booktitle={Computational Imaging},
  year={2013}
}
Scanning electron microscopes (SEMs) are used in neuroscience and materials science to image centimeters of sample area at nanometer scales. Since imaging rates are in large part SNR-limited, large collections can lead to weeks of around-the-clock imaging time. To increase data collection speed, we propose and demonstrate on an operational SEM a fast method to sparsely sample and reconstruct smooth images. To accurately localize the electron probe position at fast scan rates, we model the… CONTINUE READING
Highly Cited
This paper has 21 citations. REVIEW CITATIONS