Sparse imaging for fast electron microscopy

  title={Sparse imaging for fast electron microscopy},
  author={Hyrum S. Anderson and Jovana Ilic-Helms and Brandon Rohrer and Jason W. Wheeler and Kurt W. Larson},
  booktitle={Computational Imaging},
Scanning electron microscopes (SEMs) are used in neuroscience and materials science to image centimeters of sample area at nanometer scales. Since imaging rates are in large part SNR-limited, large collections can lead to weeks of around-the-clock imaging time. To increase data collection speed, we propose and demonstrate on an operational SEM a fast method to sparsely sample and reconstruct smooth images. To accurately localize the electron probe position at fast scan rates, we model the… CONTINUE READING
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