Space-charge distortion of transverse profiles measured by electron-based ionization profile monitors and correction methods

  title={Space-charge distortion of transverse profiles measured by electron-based ionization profile monitors and correction methods},
  author={Dominik Vilsmeier and Mariusz Sapinski and Rahul Singh},
  journal={Physical Review Accelerators and Beams},
Measurements of transverse profiles using Ionization Profile Monitors (IPMs) for high brightness beams are affected by the electromagnetic field of the beam. This interaction may cause a distortion of the measured profile shape despite strong external magnetic field applied to impose limits on the transverse movement of electrons. The mechanisms leading to this distortion are discussed in detail. The distortion itself is described by means of analytic calculations for simplified beam… 

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  • Physics
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  • Physics
  • 2011
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