Solid-state detector for ICP-OES

@inproceedings{Barnard1993SolidstateDF,
  title={Solid-state detector for ICP-OES},
  author={Thomas W. Barnard and Michael I. Crockett and Juan C. Ivaldi and Peter L. Lundberg and Dennis A. Yates and Peter Alan Levine and D. J. Sauer},
  year={1993}
}
A new type of solid-state detector has been designed to meet the needs of inductively coupled plasma optical emission spectroscopy (ICP-OES), including high quantum efficiency in the UV, low noise, wide dynamic range, rapid readout, broad spectral coverage, and high spectral resolution. The device is based on buried-channel charge-coupled-device (CCD) technology with unique features for optical emission spectroscopy and is matched to a specific echelle grating optical system described in the… CONTINUE READING

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