Soft errors in advanced computer systems

@article{Baumann2005SoftEI,
  title={Soft errors in advanced computer systems},
  author={Robert Baumann},
  journal={IEEE Design & Test of Computers},
  year={2005},
  volume={22},
  pages={258-266}
}
As the dimensions and operating voltages of computer electronics shrink to satisfy consumers' insatiable demand for higher density, greater functionality, and lower power consumption, sensitivity to radiation increases dramatically. In terrestrial applications, the predominant radiation issue is the soft error, whereby a single radiation event causes a data bit stored in a device to be corrupted until new data is written to that device. This article comprehensively analyzes soft-error… CONTINUE READING
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