Soft error immune latch design for 20 nm bulk CMOS

@article{Uemura2015SoftEI,
  title={Soft error immune latch design for 20 nm bulk CMOS},
  author={Taiki Uemura and Takashi Kato and Hideya Matsuyama and Masanori Hashimoto},
  journal={2015 IEEE International Reliability Physics Symposium},
  year={2015},
  pages={SE.4.1-SE.4.6}
}
This paper discusses soft error immune latch (SEILA) design aiming to prevent soft errors originating from charge collection to multiple nodes. We first designed 28 nm SEILA with double height cell (DHC) and evaluated its SEU rate through neutron irradiation test. The SEU rate is at the same level with 65 nm DHC-SEILA. Next, for enhancing the soft error mitigation efficiency, we designed SEILA with triple height cell (THC) in 20 nm. The 20 nm THC-SEILA achieves 14 times lower SEU rate than 28… CONTINUE READING

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SHOWING 1-10 OF 16 REFERENCES

Soft Error Hardened Latch and Its Estimation Method

  • T. Uemura, R. Tanabe, Y. Tosaka, S. Satoh
  • Jpn. J. Appl. Phys., vol. 47, no. 4, pp. 2736…
  • 2008

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