Soft-Error Probability Due to SET in Clock Tree Networks

Abstract

Technology scaling in deep-sub micron devices has increased the susceptibility of integrated circuits to radiation. Single event effect (SEE) is one of the major radiation influences that can provoke transient errors in the circuit. SEE can occur even in the clock distribution networks. During the strike of an ionizing particle, charge may be collected on… (More)
DOI: 10.1109/ISVLSI.2012.39

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