Soft Error Issues with Scaling Technologies

@article{Baeg2012SoftEI,
  title={Soft Error Issues with Scaling Technologies},
  author={Sanghyeon Baeg and Jongsun Bae and Soonyoung Lee and Chul Seung Lim and Sang Hoon Jeon and Hyeonwoo Nam},
  journal={2012 IEEE 21st Asian Test Symposium},
  year={2012},
  pages={68-68}
}
As transistor geometry shrinks, the erroneous and spurious charge from a particle strike tends to be shared by multiple nodes and causes multiple nodes upset. Such SEU mechanism invalidates the hardening principle of protecting a single node in relatively larger technologies. SEU needs to be accordingly understood and evaluated. In an 28-nm design example… CONTINUE READING