Smart selection of indirect parameters for DC-based alternate RF IC testing

Abstract

In this paper, we investigate an alternate test strategy for RF integrated circuits based on DC measurements. A methodology to select the appropriate DC parameters is presented, that allows precise estimation of the DUT performances while minimizing the number of measurements to be carried out. The method is demonstrated both on simulation test data from a… (More)
DOI: 10.1109/VTS.2012.6231074

7 Figures and Tables

Topics

  • Presentations referencing similar topics