Single view reflectance capture using multiplexed scattering and time-of-flight imaging


This paper introduces the concept of time-of-flight reflectance estimation, and demonstrates a new technique that allows a camera to rapidly acquire reflectance properties of objects from a single view-point, over relatively long distances and without encircling equipment. We measure material properties by indirectly illuminating an object by a laser source… (More)
DOI: 10.1145/2024156.2024205


10 Figures and Tables


Citations per Year

69 Citations

Semantic Scholar estimates that this publication has 69 citations based on the available data.

See our FAQ for additional information.