Single event upset characterization of the Tegra K1 mobile processor using proton irradiation

Abstract

Vroton induced SEU cross-sections of Tegra K1 mobile processor are presented. Overall upset rates of Tegra K1 in the space radiation environment are estimated. 

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Cite this paper

@article{Wang2017SingleEU, title={Single event upset characterization of the Tegra K1 mobile processor using proton irradiation}, author={Haibin Wang and Qingyu Chen and Li Chen and David M. Hiemstra and Valeri Kirischian}, journal={2017 IEEE Radiation Effects Data Workshop (REDW)}, year={2017}, pages={1-4} }