Single-Word Multiple-Bit Upsets in Static Random Access Devices

  title={Single-Word Multiple-Bit Upsets in Static Random Access Devices},
  author={OTTAinr mspscnsD}
  • OTTAinr mspscnsD
Space-borne electronics systems incorporating high-density static random access memory (SRAM) are vulnerable to single-word multiple-bit upsets (SMUs). We review here recent observations of SMU, present the results of a systematic investigation of the physical cell arrangements employed in several currently available SRAM device types, and discuss implications for the occurrence and mitigation of SMU. 
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