Single-Layer Resonant High Reflector in TE Polarization: Theory and Experiment

@article{Lee2011SingleLayerRH,
  title={Single-Layer Resonant High Reflector in TE Polarization: Theory and Experiment},
  author={Kyu Jin Lee and Robert Magnusson},
  journal={IEEE Photonics Journal},
  year={2011},
  volume={3},
  pages={123-129}
}
We present the fabrication and characterization of a guided-mode resonance-based high reflector operating in transverse-electric (TE) polarization. This reflector consists of a single periodic layer of amorphous silicon on a glass substrate. It is fabricated by silicon sputtering, holographic interference patterning, and dry etching. The measured reflectance exceeds 90% over a ~ 130-nm wavelength range with maximum reflectance of ~ 98% in a band centered at a ~ 1560-nm wavelength. The… CONTINUE READING

References

Publications referenced by this paper.
SHOWING 1-10 OF 18 REFERENCES

Shokooh-Saremi, BPhysical basis for wideband resonant reflectors,

  • M. R. Magnusson
  • Opt. Express,
  • 2008
Highly Influential
3 Excerpts

Encyclopedia of Laser Physics and Technology

  • R. Paschotta
  • Weinheim, Germany: Wiley-VCH
  • 2008
1 Excerpt

B Siliconlayer guidedmode resonance polarizer with 40nm bandwidth , [ IEEE Photon

  • R. LaComb K. J. Lee, B. Britton, +4 authors R. Magnusson
  • Technol . Lett .
  • 2004

B Ultrabroadband mirror using lowindex cladded subwavelength grating

  • C. F. R. Mateus, M. C. Y. Huang, Y. Deng, A. R. Neureuther, C. J. Chang-Hasnain
  • Technol . Lett .
  • 2004

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