Simultaneous observation of surface topography and elasticity at atomic scale by multifrequency frequency modulation atomic force microscopya)

@inproceedings{Naitoh2010SimultaneousOO,
  title={Simultaneous observation of surface topography and elasticity at atomic scale by multifrequency frequency modulation atomic force microscopya)},
  author={Yoshitaka Naitoh and Zongmin Ma and Yan Jun Li and Masami Kageshima and Yasuhiro Sugawara},
  year={2010}
}
The authors integrated the frequency modulation (FM) technique into multifrequency atomic force microscopy (AFM). Based on theoretical considerations, simultaneous excitation of the cantilever oscillation at the first and second flexural modes allows us to acquire the surface topography and surface elasticity simultaneously. The authors performed multifrequency FM-AFM observation using a tungsten-coated silicon cantilever on a Ge(001) surface exhibiting a dimer structure at room temperature… CONTINUE READING