Simulating the dynamic electrothermal behavior of power electronic circuits and systems

@article{Hefner1993SimulatingTD,
  title={Simulating the dynamic electrothermal behavior of power electronic circuits and systems},
  author={Allen R. Hefner and David L. Blackburn},
  journal={IEEE Transactions on Power Electronics},
  year={1993},
  volume={8},
  pages={376-385}
}
  • A. Hefner, D. Blackburn
  • Published 1 October 1993
  • Engineering, Physics
  • IEEE Transactions on Power Electronics
The simulator solves for the temperature distribution within the semiconductor devices, packages, and heat sinks (thermal network) as well as the currents and voltages within the electrical network. The thermal network is coupled to the electrical network through the electrothermal models for the semiconductor devices. The electrothermal semiconductor device models calculate the electrical characteristics based on the instantaneous value of the device silicon chip surface temperature and… 

Thermal component models for electro-thermal network simulations

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A rational approach to construct thermal circuit net- works equivalent to a discretization of the heat equation by the finite element method is presented.

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References

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Thermal component models for electro-thermal network simulations

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  • 1993
A procedure is given for developing thermal component models for electrothermal network simulation. The simulator solves for the temperature distribution within the semiconductor devices, packages,

A dynamic electro-thermal model for the IGBT

  • A. Hefner
  • Engineering, Physics
    Conference Record of the 1992 IEEE Industry Applications Society Annual Meeting
  • 1992
A physics-based dynamic electrothermal model is developed for the insulated-gate bipolar transistor (IGBT) by coupling a temperature-dependent IGBT electrical model with dynamic thermal models for

A review of thermal characterization of power transistors

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The implementation of the recently dcvel- oped IGBT device model into a circuit simulation program is described. It is shown that the circuit simulation program rapidly and robustly simulates the

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