Silicon molar volume discrepancy: studies of the NRLM crystal


A relatively large discrepancy was found in the molar volume of silicon crystals used to determine the Avogadro constant by means of the X-ray and crystal density (XRCD) method. Voids are suspected to cause the difference in the molar volume. Infrared laser scattering tomography, Secco-etching, electron spin resonance, and X-ray topography have been applied… (More)
DOI: 10.1109/19.918201


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