Silicalite crystal growth investigated by atomic force microscopy.

@article{Agger2003SilicaliteCG,
  title={Silicalite crystal growth investigated by atomic force microscopy.},
  author={Jonathan R. Agger and Noreen Hanif and Colin S Cundy and Andrew P Wade and Sally Dennison and Paul A Rawlinson and Michael W Anderson},
  journal={Journal of the American Chemical Society},
  year={2003},
  volume={125 3},
  pages={830-9}
}
Atomic force microscopy has been used to image the various facets of two morphologically distinct samples of silicalite. The smaller (20 microm) sample A crystals show 1 nm high radial growth terraces. The larger (240 microm) sample B crystals show growth terraces 1 to 2 orders of magnitude higher than the terraces on sample A with growth edges parallel to the crystallographic axes. Moreover, the terraces on the (010) face are significantly higher than the terraces on the (100) face… CONTINUE READING

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