Signature Testing of Analog and RF Circuits: Algorithms and Methodology

  title={Signature Testing of Analog and RF Circuits: Algorithms and Methodology},
  author={Ramakrishna Voorakaranam and Selim Sermet Akbay and Soumendu Bhattacharya and Sasikumar Cherubal and Abhijit Chatterjee},
  journal={IEEE Transactions on Circuits and Systems I: Regular Papers},
There are mainly two factors responsible for rapidly escalating production test costs of today's RF and high-speed analog circuits: 1) the high cost of high-speed and RF automatic test equipments and 2) long test times required by elaborate performance tests. In this paper, we propose a low-cost signature test methodology for accelerated production testing of analog and RF integrated circuits. As opposed to prior work, the key contribution of this paper is a new test generation algorithm that… CONTINUE READING
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