Signals induced by charge-trapping in EDELWEISS FID detectors: analytical modeling and applications

  title={Signals induced by charge-trapping in EDELWEISS FID detectors: analytical modeling and applications},
  author={The Edelweiss Collaboration Q. Arnaud and Eric Armengaud and Cyril Augier and Alain Beno{\^i}t and Luc Berg{\'e} and Jean-Christophe Billard and Johannes Blumer and Thibault de Boissiere and A. Broniatowski and Philippe Camus and Antoine Cazes and Marion Chapellier and F. Charlieux and L. Dumoulin and Klaus Eitel and Norman Foerster and Nicolas Fourches and Jules Gascon and Andrea Giuliani and Meritxell Gros and Lorenz Hehn and Geertje Heuermann and Magdia De Jesus and Yi-dong Jin and Audrey Juillard and M. Kleifges and V. Yu. Kozlov and Hannes Kraus and Cécile Kéfélian and V. A. Kudryavtsev and Herv{\'e} Lesueur and Stefanos Marnieros and X-F. Navick and Claudia Nones and Emiliano Olivieri and P. P. Pari and Bocanete Paul and M. C. Piro and D. V. Poda and E. Queguiner and S. Rozov and V{\'e}ronique Sanglard and Burkhard Schmidt and Silvia Scorza and Bernhard Siebenborn and Denis Tcherniakhovski and L. Vagneron and Marvin J. Weber and E. Yakushev},
The EDELWEISS-III direct dark matter search experiment uses cryogenic HP-Ge detectors Fully covered with Inter-Digitized electrodes (FID). They are operated at low fields (< 1 V/cm), and as a consequence charge-carrier trapping significantly affects both the ionization and heat energy measurements. This paper describes an analytical model of the signals induced by trapped charges in FID detectors based on the Shockley-Ramo theorem. It is used to demonstrate that veto electrodes, initially… CONTINUE READING


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