Signal-Margin-Screening for Multi-Mb MRAM

  title={Signal-Margin-Screening for Multi-Mb MRAM},
  author={H. Honigschmid and Philipp Beer and Andreas Bette and R. Dittrich and R. Gardic and D. Gogl and Sezer Lammers and Jurgen Schmid and L. Altimime and S. Bournat and G S Muller},
  journal={2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers},
As MRAM technology is maturing, the need for developing a strategy to identify and replace marginal bits during read/write operation becomes necessary. The methodology and circuit techniques for read/write signal-margin screening implemented in a 0.18mum 16Mb MRAM design, are described. The methodology leads to increased read/write signal margins resulting in fully functional dice by applying a wafer-level screen test including half select disturb pattern 

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