Si K-shell ionization and electron transfer cross sections: Solid targets

@inproceedings{Tawara1978SiKI,
  title={Si K-shell ionization and electron transfer cross sections: Solid targets},
  author={Hiroyuki Tawara and P. Daisley Richard and Tom J. Gray and James E. Newcomb and Keith A. Jamison and Carl Wayne Schmiedekamp and Joel Marcus Hall},
  year={1978}
}
The Si K x-ray production cross sections for F/sup q/+(q = 3--9) ion impact in the energy range of 0.4--2.2 MeV/amu are determined in the limit of a vanishingly thin target from the observed target thickness dependence of the x-ray yields. The ionization cross sections are deduced from the measured x-ray production cross sections using an average fluorescence yield (omega-tilde = 1.5..omega../sub 0/, where ..omega../sub 0/ is the fluorescence yield for an atom with single K vacancy) determined… CONTINUE READING

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