Should Illinois-scan based architectures be centralized or distributed?

@article{AlYamani2005ShouldIB,
  title={Should Illinois-scan based architectures be centralized or distributed?},
  author={Ahmad A. Al-Yamani and Narendra Devta-Prasanna and Arun Gunda},
  journal={20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05)},
  year={2005},
  pages={406-414}
}
This paper presents analysis of the trade off between hardware overhead, runtime, and test data volume when implementing systematic scan reconfiguration using centralized and distributed architectures of the segmented addressable scan, which is an Illinois-scan based architecture. The results show that the centralized scheme offers better data volume compression, similar ATPG runtime results and lower hardware overhead. The cost with the centralized scheme is in the routing congestion. 

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Cost - Effective Scan Architecture and a Test Application Scheme for Scan Testing with Non - scan Test Power and Test Application Cost ” US Patent Application 20040153978 , Aug .

  • M. Chen, S Gu
  • 2004

Cost-Effective Scan Architecture and a Test Application Scheme for Scan Testing with Non-scan Test Power and Test Application Cost

  • D. Xiang, J. Sun, M. Chen, S Gu
  • US Patent Application 20040153978,
  • 2004

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