Short pulse rating of integrated circuit conductors

@inproceedings{Kroko1970ShortPR,
  title={Short pulse rating of integrated circuit conductors},
  author={L. J. Kroko},
  year={1970}
}
Abstract The short time high current rating for aluminum conductors of the type used on presentday integrated circuits is calculated by using appropriate approximations. It is found that three failure regimes can be identified. At the highest densities, near 10 8 A/cm 2 , conductors melt as a result of temperature drop across the silicon dioxide layer under the conductors. For currents between about 5×10 7 and 10 7 A/cm 2 , failure results from oxide thermal drop and silicon chip temperature… CONTINUE READING

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Pulsed Overload Tolerance of Si/Cr, Ni/Cr and Mo/Si Thin Film Resistors on Integrated Circuits

  • IEEE Transactions on Reliability
  • 1976
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