Shape localization based on statistical method using extended local binary pattern

  title={Shape localization based on statistical method using extended local binary pattern},
  author={Xiangsheng Huang and Stan Z. Li and Yangsheng Wang},
  journal={Third International Conference on Image and Graphics (ICIG'04)},
Accurate localization of representative points of a face is crucial to many face analysis and synthesis problems. Active shape model (ASM) is a powerful statistical tool for face alignment. However, it suffers from variations of pose, illumination and expressions. In this paper, we analyze the mechanism of active shape model and realize that the ability of normal profiles to describe the local appearance pattern is very limited. For efficient appearance pattern representation, the local binary… CONTINUE READING
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